S. Dilhaire: search on Z-Library

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1

Measurement of the thermomechanical behaviour of the solder-lead interface in solder joints by laser probing : a new method for measuring the bond quality

S. Dilhaire, A. Cornet, C. Rauzan, W. Claeys, E. Schaub

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 292 KB

english, 1998

2

Measurement of the thermomechanical strain of electronic devices by shearography

S. Dilhaire, S. Jorez, A. Cornet, L.D. Patiño Lopez, W. Claeys

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 506 KB

english, 2000

3

Laser diode COFD analysis by thermoreflectance microscopy

Stefan Dilhaire, Stéphane Grauby, Sébastien Jorez, Luis-David Patino Lopez, Emmanuel Schaub, Wilfrid Claeys

Journal:

Microelectronics Reliability

Year:

2001

File:

PDF, 306 KB

2001

4

Correlating the Seebeck coefficient of thermoelectric polymer thin films to their charge transport mechanism

Petsagkourakis, Ioannis, Pavlopoulou, Eleni, Cloutet, Eric, Chen, Yan Fang, Liu, Xjianjie, Fahlman, Mats, Berggren, Magnus, Crispin, Xavier, Dilhaire, Stefan, Fleury, Guillaume, Hadziioannou, Georges

Journal:

Organic Electronics

Year:

2018

Language:

english

File:

PDF, 2.18 MB

english, 2018

5

Temperature Study of Sub-Micrometric ICs by Scanning Thermal Microscopy

Gomes, Severine, Chapuis, Pierre-Olivier, Nepveu, F., Trannoy, N., Volz, S., Charlot, B., Tessier, G., Dilhaire, S., Cretin, B., Vairac, P.

Journal:

IEEE Transactions on Components and Packaging Technologies

Year:

2007

Language:

english

File:

PDF, 3.60 MB

english, 2007

6

Thermomechanical effects in metal lines on integrated circuits analysed with a differential polarimetric interferometer

S. Dilhaire, T. Phan, E. Schaub, W. Claeys

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 703 KB

english, 1998

7

Thermomechanical deformation imaging of power devices by electronic speckle pattern interferometry (ESPI)

K. Nassim, L. Joannes, A. Cornet, S. Dilhaire, E. Schaub, W. Claeys

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 456 KB

english, 1998

8

Quantitative Thermoreflectance Imaging: Calibration Method and Validation on a Dedicated Integrated Circuit

Tessier, Gilles, Pavageau, Sabrina, Charlot, Benoit, Filloy, Celine, Fournier, Daniele, Cretin, B., Dilhaire, S., Gomes, S., Trannoy, N., Vairac, P., Volz, S.

Journal:

IEEE Transactions on Components and Packaging Technologies

Year:

2007

Language:

english

File:

PDF, 1.31 MB

english, 2007

9

Optical method for the measurement of the thermomechanical behaviour of electronic devices

S. Dilhaire, S. Jorez, A. Cornet, E. Schaub, W. Claeys

Journal:

Microelectronics Reliability

Year:

1999

Language:

english

File:

PDF, 406 KB

english, 1999

10

Fault localisation in ICs by goniometric laser probing of thermal induced surface waves

S. Dilhaire, J. Altet, S. Jorez, E. Schaub, A. Rubio, W. Claeys

Journal:

Microelectronics Reliability

Year:

1999

Language:

english

File:

PDF, 406 KB

english, 1999

11

Structurally-driven Enhancement of Thermoelectric Properties within Poly(3,4-ethylenedioxythiophene) thin Films

Petsagkourakis, Ioannis, Pavlopoulou, Eleni, Portale, Giuseppe, Kuropatwa, Bryan A., Dilhaire, Stefan, Fleury, Guillaume, Hadziioannou, Georges

Journal:

Scientific Reports

Year:

2016

Language:

english

File:

PDF, 1005 KB

english, 2016

12

Laser Seebeck Effect Imaging (SEI) and Peltier Effect Imaging (PEI): complementary investigation methods.

Stefan Dilhaire, Amine Salhi, Stéphane Grauby, Wilfrid Claeys

Journal:

Microelectronics Reliability

Year:

2003

File:

PDF, 1014 KB

2003

13

Thermal coupling in integrated circuits: application to thermal testing

Altet, J., Rubio, A., Schaub, E., Dilhaire, S., Claeys, W.

Journal:

IEEE Journal of Solid-State Circuits

Year:

2001

Language:

english

File:

PDF, 250 KB

english, 2001

14

Applications of temperature phase measurements to IC testing

J. Altet, J.M. Rampnoux, J.C. Batsale, S. Dilhaire, A. Rubio, W. Claeys, S. Grauby

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 694 KB

english, 2004

15

Thermal properties of carbon fibers at very high temperature

C. Pradere, J.C. Batsale, J.M. Goyhénèche, R. Pailler, S. Dilhaire

Journal:

Year:

2009

Language:

english

File:

PDF, 373 KB

english, 2009

16

Early detection of ageing in solder joints through laser probe thermal analysis of the peltier effect

W. Claeys, V. Quintard, S. Dilhaire, D. Lewis, Y. Danto

Journal:

Quality and Reliability Engineering International

Year:

1994

Language:

english

File:

PDF, 753 KB

english, 1994

17

Determination of passive SiO2-Au microstructure resonant frequencies.

Guillaume Marinier, Stefan Dilhaire, Luis David Patino Lopez, Mohamed Benzohra

Journal:

Microelectronics Reliability

Year:

2003

File:

PDF, 852 KB

2003

18

Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits

G. Andriamonje, V. Pouget, Y. Ousten, D. Lewis, Y. Danto, J.M. Rampnoux, Y. Ezzahri, S. Dilhaire, S. Grauby, W. Claeys, C. Rossignol, B. Audoin

Journal:

Microelectronics Reliability

Year:

2003

File:

PDF, 1.40 MB

2003

19

Si and Ge allotrope heterostructured nanowires: experimental evaluation of the thermal conductivity reduction

Ben Amor, Aymen, Djomani, Doriane, Fakhfakh, Mariam, Dilhaire, Stefan, Vincent, Laetitia, Grauby, Stéphane

Journal:

Year:

2019

Language:

english

File:

PDF, 1.47 MB

english, 2019

20

[IEEE 1997 6th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (21-25 July 1997)] Proceedings of the 1997 6th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Thermomechanical and electromigration studies with a high sensitive and high resolution laser probe

Dilhaire, S., Phan, T., Schaub, E., Claeys, W.

Year:

1997

Language:

english

File:

PDF, 693 KB

english, 1997

21

Si and Ge allotrope heterostructured nanowires: experimental evaluation of the thermal conductivity reduction

Ben Amor, Aymen, Djomani, Doriane, Fakhfakh, Mariam, Dilhaire, Stefan, Vincent, Laetitia, Grauby, Stéphane

Journal:

Year:

2019

File:

PDF, 1.47 MB

2019

22

Localisation of heat sources in electronic circuits by microthermal laser probing

Stefan Dilhaire, Emmanuel Schaub, Wilfrid Claeys, Josep Altet, Antonio Rubio

Journal:

International Journal of Thermal Sciences

Year:

2000

Language:

english

File:

PDF, 786 KB

english, 2000

23

Comparison of thermoreflectance and scanning thermal microscopy for microelectronic device temperature variation imaging: Calibration and resolution issues

Stéphane Grauby, Amine Salhi, Luis-David Patino Lopez, Wilfrid Claeys, Benoît Charlot, Stefan Dilhaire

Journal:

Microelectronics Reliability

Year:

2008

Language:

english

File:

PDF, 747 KB

english, 2008

24

Thermal diffusivity measurements on a single fiber with microscale diameter at very high temperature

C. Pradère, J.M. Goyhénèche, J.C. Batsale, S. Dilhaire, R. Pailler

Journal:

International Journal of Thermal Sciences

Year:

2006

Language:

english

File:

PDF, 351 KB

english, 2006

25

Testing of the quality of solder joints through the analysis of their thermal behaviour with an interferometric laser probe

W. Claeys, V. Quintard, S. Dilhaire, D. Lewis, Y. Danto

Journal:

Quality and Reliability Engineering International

Year:

1994

Language:

english

File:

PDF, 650 KB

english, 1994

26

ElectroStatic Discharge Fault Localization by Laser Probing

S. Grauby, A. Salhi, W. Claeys, D. Trias, S. Dilhaire

Journal:

Microelectronics Reliability

Year:

2005

Language:

english

File:

PDF, 1.20 MB

english, 2005

27

Time gating imaging through thick silicon substrate: a new step towards backside characterisation

J.M. Rampnoux, H. Michel, M.A. Salhi, S. Grauby, W. Claeys, S. Dilhaire

Journal:

Microelectronics Reliability

Year:

2006

File:

PDF, 3.39 MB

2006

28

High sensitivity and high resolution differential interferometer: Micrometric polariscope for thermomechanical studies in microelectronics

S. Dilhaire, T. Phan, E. Schaub, W. Claeys

Journal:

Microelectronics Reliability

Year:

1997

Language:

english

File:

PDF, 370 KB

english, 1997

29

Laser probing of thermal behaviour of electronic components and its application in quality and reliability testing

W. Claeys, S. Dilhaire, V. Quintard

Journal:

Microelectronic Engineering

Year:

1994

Language:

english

File:

PDF, 1.01 MB

english, 1994

30

High-resolution interferometry and electronic speckle pattern interferometry applied to the thermomechanical study of a MOS power transistor

K Nassim, L Joannes, A Cornet, S Dilhaire, E Schaub, W Claeys

Journal:

Microelectronics Journal

Year:

1999

Language:

english

File:

PDF, 275 KB

english, 1999

31

Laser scanning thermoreflectance imaging system using galvanometric mirrors for temperature measurements of microelectronic devices

S. Grauby, A. Salhi, J. Rampnoux, H. Michel, W. Claeys, S. Dilhaire

Year:

2007

Language:

english

File:

PDF, 778 KB

english, 2007

32

Four different approaches for the measurement of IC surface temperature: application to thermal testing

Josep Altet, Stefan Dilhaire, Sebastian Volz, Jean-Michel Rampnoux, Antonio Rubio, Stephane Grauby, Luis David Patino Lopez, Wilfrid Claeys, Jean-Bernard Saulnier

Journal:

Microelectronics Journal

Year:

2002

Language:

english

File:

PDF, 500 KB

english, 2002

33

Thermoreflectance temperature measurement with millimeter wave

Pradere, C., Caumes, J.-P., BenKhemis, S., Pernot, G., Palomo, E., Dilhaire, S., Batsale, J.-C.

Journal:

Review of Scientific Instruments

Year:

2014

Language:

english

File:

PDF, 613 KB

english, 2014

34

Laser beam thermography of circuits in the particular case of passivated semiconductors

V. Quintard, G. Deboy, S. Dilhaire, D. Lewis, T. Phan, W. Claeys

Journal:

Microelectronic Engineering

Year:

1996

Language:

english

File:

PDF, 423 KB

english, 1996

35

Fabrication of Bi2Te3 nanowire arrays and thermal conductivity measurement by 3ω-scanning thermal microscopy

Muñoz Rojo, M., Grauby, S., Rampnoux, J.-M., Caballero-Calero, O., Martin-Gonzalez, M., Dilhaire, S.

Journal:

Journal of Applied Physics

Year:

2013

Language:

english

File:

PDF, 872 KB

english, 2013

36

Study of thermomechanical properties of Si∕SiGe superlattices using femtosecond transient thermoreflectance technique

Ezzahri, Y., Dilhaire, S., Grauby, S., Rampnoux, J. M., Claeys, W., Zhang, Y., Zeng, G., Shakouri, A.

Journal:

Applied Physics Letters

Year:

2005

Language:

english

File:

PDF, 296 KB

english, 2005

37

Anisotropic propagation imaging of elastic waves in oriented columnar thin films

Coffy, Etienne, Dodane, Guillaume, Euphrasie, Sebastien, Mosset, Alexis, Vairac, Pascal, MARTIN, Nicolas, Baida, Hatem, Rampnoux, Jean-Michel, Dilhaire, Stefan

Journal:

Journal of Physics D Applied Physics

Year:

2017

Language:

english

File:

PDF, 1.08 MB

english, 2017

38

An improved technique for optical interferometric imaging of isolated cells

E. Laffon, S. Dilhaire, J.-L. Leveque, P. Corcuff

Journal:

Cytometry Part A

Year:

1996

Language:

english

File:

PDF, 371 KB

english, 1996

39

Generation and Detection of Shear Acoustic Waves in Metal Submicrometric Films with Ultrashort Laser Pulses

Rossignol, C., Rampnoux, J., Perton, M., Audoin, B., Dilhaire, S.

Journal:

Physical Review Letters

Year:

2005

Language:

english

File:

PDF, 251 KB

english, 2005

40

Temperature variation mapping of a microelectromechanical system by thermoreflectance imaging

Grauby, S., Dilhaire, S., Jorez, S., Claeys, W.

Journal:

IEEE Electron Device Letters

Year:

2005

Language:

english

File:

PDF, 285 KB

english, 2005

41

[ASME ASME 2009 Second International Conference on Micro/Nanoscale Heat and Mass Transfer - Shanghai, China (December 18–21, 2009)] ASME 2009 Second International Conference on Micro/Nanoscale Heat and Mass Transfer, Volume 2 - Nanoscale Thermal Transport Studied With Heterodyne Picosecond Thermoreflectance

Dilhaire, Stefan, Rampnoux, Jean-Michel, Grauby, Stephane, Pernot, Gilles, Calbris, Gaetan

Year:

2009

Language:

english

File:

PDF, 687 KB

english, 2009

42

Modelling and experimental study of heat deposition and transport in a semiconductor laser diode

D. Lewis, S. Dilhaire, T. Phan, V. Quintard, V. Hornung, W. Claeys

Journal:

Microelectronics Journal

Year:

1998

Language:

english

File:

PDF, 665 KB

english, 1998

43

Si and SiGe Nanowires: Fabrication Process and Thermal Conductivity Measurement by 3ω-Scanning Thermal Microscopy

Grauby, Stéphane, Puyoo, Etienne, Rampnoux, Jean-Michel, Rouvière, Emmanuelle, Dilhaire, Stefan

Journal:

The Journal of Physical Chemistry C

Year:

2013

Language:

english

File:

PDF, 1.20 MB

english, 2013

44

Thermomechanical study of AlCu based interconnect under pulsed thermoelectric excitation

Phan, T., Dilhaire, S., Quintard, V., Lewis, D., Claeys, W.

Journal:

Journal of Applied Physics

Year:

1997

Language:

english

File:

PDF, 536 KB

english, 1997

45

Temperature measurements of metal lines under current stress by high-resolution laser probing

Quintard, V., Dilhaire, S., Tam Phan, Claeys, W.

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

1999

Language:

english

File:

PDF, 161 KB

english, 1999

46

Dynamic Surface Temperature Measurements in ICs

Altet, J., Claeys, W., Dilhaire, S., Rubio, A.

Journal:

Proceedings of the IEEE

Year:

2006

Language:

english

File:

PDF, 1.17 MB

english, 2006

47

Investigating Coherent Zone-Folded Acoustic Phonons in Si/SiGe Superlattices by Transient Thermoreflectance Technique

Michel, Hélène, Pernot, Gilles, Rampnoux, Jean-Michel, Dilhaire, Stefan, Grauby, Stéphane, Ezzahri, Younès, Shakouri, Ali

Journal:

MRS Proceedings

Year:

2009

Language:

english

File:

PDF, 640 KB

english, 2009

48

Thermoreflectance calibration procedure on a laser diode: application to catastrophic optical facet damage analysis

S. Dilhaire, S. Grauby, W. Claeys

Journal:

IEEE Electron Device Letters

Year:

2005

Language:

english

File:

PDF, 161 KB

english, 2005

49

Strategies for built-in characterization testing and performance monitoring of analog RF circuits with temperature measurements

Aldrete-Vidrio, Eduardo, Mateo, Diego, Altet, Josep, Salhi, M Amine, Grauby, Stéphane, Dilhaire, Stefan, Onabajo, Marvin, Silva-Martinez, Jose

Journal:

Measurement Science and Technology

Year:

2010

Language:

english

File:

PDF, 2.41 MB

english, 2010

50

Thermal parameters identification of micrometric layers of microelectronic devices by thermoreflectance microscopy

Stefan Dilhaire, Stéphane Grauby, Wilfrid Claeys, Jean-Christophe Batsale

Journal:

Microelectronics Journal

Year:

2004

Language:

english

File:

PDF, 207 KB

english, 2004

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